NSN 5961-00-175-2844 Semiconductor Device Set manufactured by Semi General Inc, Micrometrics Inc, Hewlett Packard Co, Avago Technologies Us Inc, Fei Microwave Inc is available within ASAP Part Service’s ready-to-ship inventory. Owned and operated by ASAP Semiconductor, ASAP Part Services has over 6 billion parts within its inventory including 5082-2712, A2S713M. ASAP is committed to streamlining the parts procurement process for our customers. We make it easy for our customers to search through billions of parts to find the exact part they are looking for.
A dedicated ASAP account manager is ready to help solve any procurement issues or needs that a customer may have. As a company we are quick and responsive meaning we can deliver a part within an AOG timeframe. Quality control is at the center of all that we do. Each and every NSN 5961-00-175-2844 part is subject to numerous quality checks that are designed to screen out any part imperfections or validity issues. Subject a request for quote for NSN 5961-00-175-2844 part today and allow us to simplify your procurement process.
Alternative NSN: 5961-00-175-2844 |
Item Name:Semiconductor Device Set |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5961 Semiconductor Devices and Associated Hardware |
NCB Code: USA (00) |
Manufacturers: Semi General Inc , Micrometrics Inc , Hewlett Packard Co , Avago Technologies Us Inc , Fei Microwave Inc , Frequency Electronics Inc |
Semi General Inc | Micrometrics Inc | Hewlett Packard Co |
Avago Technologies Us Inc | Fei Microwave Inc | Frequency Electronics Inc |
Part No Part No
|
Manufacturer NSN Parts
|
Item Name Item Name
|
QTY QTY
|
RFQ RFQ
|
---|---|---|---|---|
5082-2712 | Semi General Inc | semiconductor device set | Avl | RFQ |
5082-2712 | Micrometrics Inc | semiconductor device set | Avl | RFQ |
5082-2712 | Hewlett Packard Co | semiconductor device set | Avl | RFQ |
5082-2712 | Avago Technologies Us Inc | semiconductor device set | Avl | RFQ |
A2S713M | Fei Microwave Inc | semiconductor device set | Avl | RFQ |
A2S713M | Frequency Electronics Inc | semiconductor device set | Avl | RFQ |
A2S713M | Micrometrics Inc | semiconductor device set | Avl | RFQ |
A2S713M | Avago Technologies Us Inc | semiconductor device set | Avl | RFQ |
A2S713M | Semi General Inc | semiconductor device set | Avl | RFQ |
F10NB-L01-0001 | Semi General Inc | semiconductor device set | Avl | RFQ |
F10NB-L01-0001 | Micrometrics Inc | semiconductor device set | Avl | RFQ |
F10NB-L01-0001 | Frequency Electronics Inc | semiconductor device set | Avl | RFQ |
F10NB-L01-0001 | Fei Microwave Inc | semiconductor device set | Avl | RFQ |
F10NB-L01-0001 | Avago Technologies Us Inc | semiconductor device set | Avl | RFQ |
HP5082-2712 | Avago Technologies Us Inc | semiconductor device set | Avl | RFQ |
HP5082-2712 | Hewlett Packard Co | semiconductor device set | Avl | RFQ |
HP5082-2712 | Micrometrics Inc | semiconductor device set | Avl | RFQ |
HP5082-2712 | Semi General Inc | semiconductor device set | Avl | RFQ |
UX2712 | Semi General Inc | semiconductor device set | Avl | RFQ |
UX2712 | Micrometrics Inc | semiconductor device set | Avl | RFQ |
UX2712 | Avago Technologies Us Inc | semiconductor device set | Avl | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | CERAMIC ALL SEMICONDUCTOR DEVICE DIODE |
ABHP | OVERALL LENGTH | 0.190 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.210 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
ADAV | OVERALL DIAMETER | 0.078 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.084 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
AFZC | FUNCTION FOR WHICH DESIGNED | DETECTOR AND MIXER |
ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
AXGY | MOUNTING METHOD | PRESS FIT ALL SEMICONDUCTOR DEVICE DIODE |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS JUNCTION ALL SEMICONDUCTOR DEVICE DIODE |
FEAT | SPECIAL FEATURES | 9.3 GHZ TEST FREQUENCY; 6.5 DECIBEL NOISE FIGURE |
TTQY | TERMINAL TYPE AND QUANTITY | 2 BINDING POST ALL SEMICONDUCTOR DEVICE DIODE |
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