NSN 6625-01-192-7577 Test Set Semiconductor Device manufactured by Hewlett Packard Co, Agilent Technologies Inc is available within ASAP Part Service’s ready-to-ship inventory. Owned and operated by ASAP Semiconductor, ASAP Part Services has over 6 billion parts within its inventory including 4145A. ASAP is committed to streamlining the parts procurement process for our customers. We make it easy for our customers to search through billions of parts to find the exact part they are looking for.
A dedicated ASAP account manager is ready to help solve any procurement issues or needs that a customer may have. As a company we are quick and responsive meaning we can deliver a part within an AOG timeframe. Quality control is at the center of all that we do. Each and every NSN 6625-01-192-7577 part is subject to numerous quality checks that are designed to screen out any part imperfections or validity issues. Subject a request for quote for NSN 6625-01-192-7577 part today and allow us to simplify your procurement process.
Alternative NSN: 6625-01-192-7577 |
Item Name:Test Set Semiconductor Device |
FSG: 66 Instruments and Laboratory Equipment |
Federal Supply Class (FSC): 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
NCB Code: USA (01) |
Manufacturers: Hewlett Packard Co , Agilent Technologies Inc |
Part No Part No
|
Manufacturer NSN Parts
|
Item Name Item Name
|
QTY QTY
|
RFQ RFQ
|
---|---|---|---|---|
4145A | Hewlett Packard Co | test set semiconductor device | Avl | RFQ |
4145A | Agilent Technologies Inc | test set semiconductor device | Avl | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
SR-5 | DESIGN CONTROL REFERENCE | 4145A |
ACZB | FREQUENCY RATING | 48.0 HERTZ MINIMUM AND 66.0 HERTZ MAXIMUM |
SR-5 | THE MANUFACTURERS DATA | |
ABGL | WIDTH | 16.750 INCHES NOMINAL |
SR-5 | MANUFACTURERS CODE | 1LQK8 |
FCLS | III FUNCTIONAL CLASSIFICATION | AA-9.6 |
HGTH | HEIGHT | 9.060 INCHES NOMINAL |
ANPZ | INCLOSURE FEATURE | MULTIPLE ITEM W/HOUSING |
AEJZ | DEPTH | 24.100 INCHES NOMINAL |
AQXY | TEST TYPE FOR WHICH DESIGNED | STIMULATES VOLTAGE & CURRENT SENSITIVE DEVICES & MEASURES RESULTING CURRENT & VOLTAGE RESPONSES |
AEAS | MAJOR COMPONENTS | SEMICONDUCTOR PARAMETER ANALYZER 1; PLUG-IN MODULE 7 |
AQXZ | OPERATING TEST CAPABILITY | VOLTAGE 3 RANGES: PORM 100 VOLTS; CURRENT 9 RANGES PORM 100 MILLIAMPS |
NTRD | III ENTRY DATE | 92-07-15 |
ACYN | AC VOLTAGE RATING | 100.0 VOLTS NOMINAL AND 120.0 VOLTS NOMINAL AND 220.0 VOLTS NOMINAL AND 240.0 VOLTS NOMINAL |
AKWC | ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
ALSF | INTERNAL BATTERY ACCOMMODATION | NOT INCLUDED |
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