NSN 6625-00-893-2628 Test Set Semiconduc, Test Set Semiconductor Device manufactured by Joslyn Corp, Litton Systems Inc, Joint Electronics Type Designation is available within ASAP Part Service’s ready-to-ship inventory. Owned and operated by ASAP Semiconductor, ASAP Part Services has over 6 billion parts within its inventory including 190-31-1, 219B. ASAP is committed to streamlining the parts procurement process for our customers. We make it easy for our customers to search through billions of parts to find the exact part they are looking for.
A dedicated ASAP account manager is ready to help solve any procurement issues or needs that a customer may have. As a company we are quick and responsive meaning we can deliver a part within an AOG timeframe. Quality control is at the center of all that we do. Each and every NSN 6625-00-893-2628 part is subject to numerous quality checks that are designed to screen out any part imperfections or validity issues. Subject a request for quote for NSN 6625-00-893-2628 part today and allow us to simplify your procurement process.
Alternative NSN: 6625-00-893-2628 |
Item Name:Test Set Semiconduc |
FSG: 66 Instruments and Laboratory Equipment |
Federal Supply Class (FSC): 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
NCB Code: USA (00) |
Manufacturers: Joslyn Corp , Litton Systems Inc , Joint Electronics Type Designation |
Part No Part No
|
Manufacturer NSN Parts
|
Item Name Item Name
|
QTY QTY
|
RFQ RFQ
|
---|---|---|---|---|
190-31-1 | Joslyn Corp | test set semiconduc | Avl | RFQ |
190-31-1 | Litton Systems Inc | test set semiconductor device | Avl | RFQ |
190-31-1 | Joint Electronics Type Designation | test set semiconductor device | Avl | RFQ |
219B | Litton Systems Inc | test set semiconductor device | Avl | RFQ |
219B | Joslyn Corp | test set semiconduc | Avl | RFQ |
219B | Joint Electronics Type Designation | test set semiconductor device | Avl | RFQ |
SK14710-3 | Joint Electronics Type Designation | test set semiconductor device | Avl | RFQ |
SK14710-3 | Joslyn Corp | test set semiconduc | Avl | RFQ |
SK14710-3 | Litton Systems Inc | test set semiconductor device | Avl | RFQ |
TS1836U | Litton Systems Inc | test set semiconductor device | Avl | RFQ |
TS1836U | Joslyn Corp | test set semiconduc | Avl | RFQ |
TS1836U | Joint Electronics Type Designation | test set semiconductor device | Avl | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
HGTH | HEIGHT | 8.500 INCHES NOMINAL |
ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
ABGL | WIDTH | 6.870 INCHES NOMINAL |
FCLS | III FUNCTIONAL CLASSIFICATION | AA-9.3 |
AKWB | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TYPE NO. TS-1836/U |
ANNQ | MATERIAL AND LOCATION | PLASTIC HOUSING |
AQXY | TEST TYPE FOR WHICH DESIGNED | MEASUREMENT OF BETA PARAMETER AND LEAKAGE CURRENT |
AKWA | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST SET,TRANSISTOR |
ABRY | LENGTH | 6.370 INCHES NOMINAL |
AQXZ | OPERATING TEST CAPABILITY | BETA TEST RANGE 1 TO 300,LEAKAGE CURRENT TEST RANGE 0 TO 500 UA |
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