NSN 6625-01-085-8037 Test Set Semiconductor Device manufactured by Huntron Inc is available within ASAP Part Service’s ready-to-ship inventory. Owned and operated by ASAP Semiconductor, ASAP Part Services has over 6 billion parts within its inventory including 1005B, 1005B-1, HTR 1005B, HTR1005B-1. ASAP is committed to streamlining the parts procurement process for our customers. We make it easy for our customers to search through billions of parts to find the exact part they are looking for.
A dedicated ASAP account manager is ready to help solve any procurement issues or needs that a customer may have. As a company we are quick and responsive meaning we can deliver a part within an AOG timeframe. Quality control is at the center of all that we do. Each and every NSN 6625-01-085-8037 part is subject to numerous quality checks that are designed to screen out any part imperfections or validity issues. Subject a request for quote for NSN 6625-01-085-8037 part today and allow us to simplify your procurement process.
Alternative NSN: 6625-01-085-8037 |
Item Name:Test Set Semiconductor Device |
FSG: 66 Instruments and Laboratory Equipment |
Federal Supply Class (FSC): 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
NCB Code: USA (01) |
Manufacturers: Huntron Inc |
Part No Part No
|
Manufacturer NSN Parts
|
Item Name Item Name
|
QTY QTY
|
RFQ RFQ
|
---|---|---|---|---|
1005B | Huntron Inc | test set semiconductor device | Avl | RFQ |
1005B-1 | Huntron Inc | test set semiconductor device | Avl | RFQ |
HTR 1005B | Huntron Inc | test set semiconductor device | Avl | RFQ |
HTR1005B-1 | Huntron Inc | test set semiconductor device | Avl | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
AEJZ | DEPTH | 11.250 INCHES NOMINAL |
ALSF | INTERNAL BATTERY ACCOMMODATION | NOT INCLUDED |
SR-5 | MANUFACTURERS CODE | 57705 |
FAAZ | PHASE | SINGLE |
SR-5 | DESIGN CONTROL REFERENCE | HTR 1005B |
ACZB | FREQUENCY RATING | 60.0 HERTZ NOMINAL |
SURF | SURFACE TREATMENT | PLASTIC |
AKWC | ELECTRICAL POWER SOURCE RELATIONSHIP | ALTERNATE OPERATING |
ACYN | AC VOLTAGE RATING | 115.0 VOLTS NOMINAL |
AQXY | TEST TYPE FOR WHICH DESIGNED | COMPARITOR FUNCTION,CIRCUIT BOARDS WITH INTEGRATED CIRCUITS OR HYBRID CIRCUITS;IN-CIRCUIT TESTING AT LOW,MEDIUM AND HIGH IMPEDANCE;CIRCUIT TESTING FOR CURRENT-LIMITED CIRCUIT PROTECTION;IN-CIRCUIT TEST OF SOLID STATE COMPONENTS;RELIABLE TESTING OF ELECTROLYTIC CAPACITORS |
ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
ANNQ | MATERIAL AND LOCATION | PLASTIC HOUSING |
AEAS | MAJOR COMPONENTS | TESTER,SOLID STATE;TEST PROBES AND CABLES |
ABGL | WIDTH | 10.000 INCHES NOMINAL |
HGTH | HEIGHT | 3.375 INCHES NOMINAL |
AQXZ | OPERATING TEST CAPABILITY | VISUAL SCOPE DISPLAY PROJECTING IMAGES INDICATING CONDITION OF A DEVICE UNDER TEST |
SR-5 | THE MANUFACTURERS DATA |
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