NSN 6625-01-476-1772 Test Program Set manufactured by Advanced Testing Technologies Inc is available within ASAP Part Service’s ready-to-ship inventory. Owned and operated by ASAP Semiconductor, ASAP Part Services has over 6 billion parts within its inventory including B504OPTION500. ASAP is committed to streamlining the parts procurement process for our customers. We make it easy for our customers to search through billions of parts to find the exact part they are looking for.
A dedicated ASAP account manager is ready to help solve any procurement issues or needs that a customer may have. As a company we are quick and responsive meaning we can deliver a part within an AOG timeframe. Quality control is at the center of all that we do. Each and every NSN 6625-01-476-1772 part is subject to numerous quality checks that are designed to screen out any part imperfections or validity issues. Subject a request for quote for NSN 6625-01-476-1772 part today and allow us to simplify your procurement process.
Alternative NSN: 6625-01-476-1772 |
Item Name:Test Program Set |
FSG: 66 Instruments and Laboratory Equipment |
Federal Supply Class (FSC): 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
NCB Code: USA (01) |
Manufacturers: Advanced Testing Technologies Inc |
Part No Part No
|
Manufacturer NSN Parts
|
Item Name Item Name
|
QTY QTY
|
RFQ RFQ
|
---|---|---|---|---|
B504OPTION500 | Advanced Testing Technologies Inc | test program set | Avl | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
MRC | Decoded Requirement | Clear Text Reply |
CXCY | Part Name Assigned By Controlling Agency | OPTION 504 HIGH DIGITAL TEST SYSTEM |
FEAT | Special Features | SAME AS THE BRAT B504 50 MHZ HIGHSPEED DIGITAL TEST SYSTEM; CAN BE USEDIN A VARIETY OF BRAT TEST STATION; RECONFIGURABLE WITH ROOM FOR EXPANSION; THE INTERFACE, 320/640 HIGH SPEED DIGITAL INPUT/OUTPUT PINS; HAS ANALOG TEST POINTS; MULTIPLE PROGRAMMABLE AC AND DC POWER SYSTEMS ARE RECONFIGURABLE PRECISION POWER SUBSYSTEMS; HIGH SPEED DYNAMIC DIGITAL; SEVEN DISTINCT I/O MEMORY TYPES DATA FORMATTING W/ PRECIES EDGE PLACEMENT; INTENED FOR USE IN AN AUTOMATIC TESTING ENVIRONMENT THAT REQUIRES HIGH SPEED DIGITAL STIMULUS AND RESPONSE CAPABILITIES FOR SERIAL AND PARALLEL TESTING; THIS BRAT SYSTEM IS IN AN MS-WINDOWS ENVIRONMENT; OPTION 500 ADDS INCREASED PIN COUNT FROM 640 TO 800+ TO ACCOMMODATE THE AMP (728I/O) AND THE VIM (637 I/O) |
AJKE | End Item Source | 0DRX9 |
AGAV | End Item Identification | USED WITH BRAT TEST STATIONS |
AFJS | Portability Method | BRAKE TYPE CASTERS |
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